Thickness dependence of interlayer fringe-field coupling in submicrometer NiFe/Cu multilayered pillars

✍ Scribed by Zhang, M.; Nozaki, Y.; Matsuyama, K.

• Book ID: 114650347
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 150 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2005.854752