✦ LIBER ✦
Thickness dependence of In content of InGaN mixed films by high-resolution Rutherford backscattering spectrometry
✍ Scribed by H. Sakuta; Y. Yamanaka; S. Kurai; T. Taguchi
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 142 KB
- Volume
- 232
- Category
- Article
- ISSN
- 0168-583X
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