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Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer

โœ Scribed by de Oliveira, Elisabeth A. ;Frejlich, Jaime

Book ID
115340047
Publisher
The Optical Society
Year
1989
Tongue
English
Weight
754 KB
Volume
28
Category
Article
ISSN
1559-128X

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of Lloydร•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me