Thickness and field dependence of defects in silicon dioxide : D. Baglee, A. K. Zakzouk, W. Eccleston and R. A. Stuart. Solid-St. Electron. 21, 763 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 133 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90290-1