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Thick target X-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of pottery

✍ Scribed by D. Tenorio; G. Costa; M. Bordas; J. Larcher; G. Lagarde; C. Heitz; A. Jaidar


Book ID
113277777
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
282 KB
Volume
15
Category
Article
ISSN
0168-583X

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