✦ LIBER ✦
Thick-Strained-Si/SiGe CMOS Technology With Selective-Epitaxial-Si Shallow-Trench Isolation
✍ Scribed by Miyamoto, M..; Sugii, N..; Hoshino, Y..; Yoshida, Y..; Kondo, M..; Kimura, Y..; Ohnishi, K..
- Book ID
- 114618847
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 905 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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