The variable-range hopping expression R(T)= Ro e(TΒ°/rl~ used to describe data for carbon and thick film chip resistors is discussed. For both kinds of resistors it was found that 1/4 \_\_\_(~ \_\_\_ 1/2, although for the thick film resistors the applicability of models originally used in doped semic
Thick film chip resistors for use as low temperature thermometers
β Scribed by Q. Li; C.H. Watson; R.G. Goodrich; D.G. Haase; H. Lukefahr
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 344 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0011-2275
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β¦ Synopsis
We have measured the resistance and magnetoresistance of commercially produced thick film resistors in the range 80 K-15 mK and in fields up to 20 T. These resistors behave similarly to those produced by another manufacturer and characterized recently by a Japanese group.
Between 2.5 and O. 1 K the resistance of a 1 kf~ resistor can be fit to R = Aexp(B/T 1/4). A 100 kf~ resistor appears to fit a similar expression between 1.6 and 6 K and fits a T-1/2 law from 8 to 80 K. These resistors are very stable upon thermal cycling, have a small magnetoresistance, and should be useful as thermometers over a wide temperature range.
π SIMILAR VOLUMES
A thin-film platinum resistance thermometer (SDT101A, Tame Electric Work Company, Japan), which is available commercially, has useful characteristics for thermometry in the range of 20 to 300 K and in high magnetic fields up to 5 T. The Z function-table of this platinum resistance thermometer (PRT)