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Thermoreflectance temperature imaging of integrated circuits: calibration technique and quantitative comparison with integrated sensors and simulations

✍ Scribed by Tessier, G; Polignano, M-L; Pavageau, S; Filloy, C; Fournier, D; Cerutti, F; Mica, I

Book ID: 119971448
Publisher: Institute of Physics
Year: 2006
Tongue: English
Weight: 466 KB
Volume: 39
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/39/19/007

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