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Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

✍ Scribed by W. Claeys; S. Dilhaire; V. Quintard; J. P. Dom; Y. Danto


Book ID
112184872
Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
526 KB
Volume
9
Category
Article
ISSN
0748-8017

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