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Thermophysical devices for high temperature measurements

โœ Scribed by Yu. A. Kocherzhinsky; V. Z. Turkevich; V. I. Vasilenko; A. V. Zolotukhin


Book ID
110552051
Publisher
Springer Netherlands
Year
1995
Tongue
English
Weight
194 KB
Volume
44
Category
Article
ISSN
0022-5215

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Obtaining repeatable critical current measurements for a high temperature superconductor (HTS) is a challenging task, since HTSs are highly susceptible to degradation due to mechanical stress, moisture, thermal cycling and aging. This paper discusses the development of a high temperature superconduc