Topography and structure of C60/C70+Ni f
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E. Czerwosz; P. Dลuลผewski; R. Nowakowski; H. Wronka
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Article
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1999
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Elsevier Science
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English
โ 382 KB
The structural changes occurring during the vacuum annealing, accompanied by Ni in C /C #Ni layers were studied by atomic force microscopy (AFM), transmission electron microscopy (TEM), electron diffraction (ED) and Raman spectroscopy (RS). The layers were prepared by thermal deposition method and c