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Thermally stimulated conductivity of Cu3BiS3thin films deposited by co-evaporation: determination of trap parameters related to defects in the gap

✍ Scribed by Dussan, A.; Murillo, J. M.; Mesa, F.


Book ID
113070029
Publisher
Springer
Year
2012
Tongue
English
Weight
322 KB
Volume
47
Category
Article
ISSN
0022-2461

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