Thermal Transient Effect and Improved Junction Temperature Measurement Method in High-Voltage Light-Emitting Diodes

✍ Scribed by Ye, Huaiyu; Chen, Xianping; van Zeijl, Henk; Gielen, Alexander W. J.; Zhang, Guoqi

• Book ID: 121346752
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 1024 KB
• Volume: 34
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2013.2274473