In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing
Thermal Testing of Integrated Circuits
β Scribed by Josep Altet, Antonio Rubio (auth.)
- Publisher
- Springer US
- Year
- 2002
- Tongue
- English
- Leaves
- 211
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds of millions of devices. They work at extremely low voltages and switch at very high frequencies. Testing of circuits has become an essential process in IC manufacturing, in the effort to ensure that the manufactured components have the appropriate levels of quality. Along with the ongoing trend towards more advanced technology and circuit features, major testing challenges are continuously emerging. The use of ambivalent procedures to test the analogue and digital sections of such complex circuits without interfering in their nominal operation is clearly a critical part of today's technological ipdustries. Chapter 1 presents the general purposes and basic concepts rel~ted With' the"testing of integrated circuits, discussing the various strategies and their limitations. Readers who are already familiar with the field may opt to skip this chapter. This book offers a multidisciplinary focus on thermal testing. This is a testing method which is not only suitable for use in combination with other existing techniques, but is also backed by a wealth of knowledge and offers exciting opportunities in the form of as yet unexplored areas of research and innovation for industrial applications.
β¦ Table of Contents
Front Matter....Pages i-xiv
Introduction to the testing of integrated circuits....Pages 1-21
Thermal transfer and thermal coupling in ICβs....Pages 23-51
Thermal analysis in integrated circuits....Pages 53-96
Temperature as a test observable variable in ICs....Pages 97-138
Thermal monitoring of ICβs....Pages 139-183
Feasibility analysis and conclusions....Pages 185-199
Back Matter....Pages 201-204
β¦ Subjects
Circuits and Systems; Electrical Engineering; Manufacturing, Machines, Tools
π SIMILAR VOLUMES
<p><P>Thermal modeling of high performance circuits and systems is a crucial component for thermal and power management. The VLSI community is currently lacking a methodology to model and estimate junction temperature at any level of design other than low-level (transistor-level) circuits. The accur
<P>This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips</div> <
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Β Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a t
<p><P>Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous