✦ LIBER ✦
Thermal Stress and Stacking Fault Energy Estimated by TEM Observations of Grown-in Dislocations in Si-Doped GaAs Single Crystals
✍ Scribed by Nakada, Y. ;Imura, T.
- Publisher
- John Wiley and Sons
- Year
- 1987
- Tongue
- English
- Weight
- 518 KB
- Volume
- 103
- Category
- Article
- ISSN
- 0031-8965
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