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Thermal strain-induced dielectric anisotropy in Ba[sub 0.7]Sr[sub 0.3]TiO[sub 3] thin films grown on silicon-based substrates

✍ Scribed by Zhu, X. H.; Guigues, B.; DefayÌ, E.; Dubarry, C.; AiÌd, M.

Book ID: 121232004
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 734 KB
Volume: 106
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3186019

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