Thermal-stability performance of a metamorphic high electron mobility transistor (MHEMT) with non-annealed Ohmic contacts

✍ Scribed by Li-Yang Chen; Shiou-Ying Cheng; Chien-Chang Huang; Tzu-Pin Chen; Tsung-Han Tsai; Yi-Jung Liu; Tai-You Chen; Chi-Hsiang Hsu; Wen-Chau Liu

• Book ID: 108271760
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 509 KB
• Volume: 54
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2009.10.009