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Thermal stability of the exchanged biased CoFe/IrMn electrode for the magnetic tunnel junction as a function of CoFe thickness

✍ Scribed by Lee, J. H.; Kim, S. J.; Yoon, C. S.; Kim, C. K.; Park, B. G.; Lee, T. D.


Book ID
126797658
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
363 KB
Volume
92
Category
Article
ISSN
0021-8979

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