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Thermal stability of AlSiCu/Wn+p diodes with and without TiN barrier layer

✍ Scribed by Wen-Kuan Yeh; Mao-Chieh Chen; Pei-Jan Wang; Lu-Min Liu; Mou-Shiung Lin


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
628 KB
Volume
270
Category
Article
ISSN
0040-6090

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