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Thermal stability of Al/nanocrystalline-Si bilayers investigated by in situ heating energy-filtered transmission electron microscopy

✍ Scribed by Z. M. Wang; L. Gu; L. P. H. Jeurgens; E. J. Mittemeijer


Book ID
106396492
Publisher
Springer
Year
2011
Tongue
English
Weight
310 KB
Volume
46
Category
Article
ISSN
0022-2461

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