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Thermal stability and degradation mechanism of NiFe/Cu giant magnetoresistance multilayer systems

✍ Scribed by Hecker, M.; Tietjen, D.; Schneider, C. M.; Cramer, N.; Malkinski, L.; Camley, R. E.; Celinski, Z.

Book ID: 127381706
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 223 KB
Volume: 91
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1452201

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