✦ LIBER ✦
Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. II. Practice and experiments
✍ Scribed by Bagnoli, P.E.; Casarosa, C.; Dallago, E.; Nardoni, M.
- Book ID
- 118168465
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 245 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0885-8993
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