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Thermal reliability and performances of InGaP schottky contact with Cu/Au and Au/Cu-MSM photodetectors

✍ Scribed by Chang-Da Tsai; Ching-Ting Lee

Book ID
111708155
Publisher
Springer US
Year
2001
Tongue
English
Weight
369 KB
Volume
30
Category
Article
ISSN
0361-5235

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πŸ“œ SIMILAR VOLUMES

On barrier height inhomogeneities of Au
On barrier height inhomogeneities of Au and Cu/n-InP Schottky contacts
✍ H. Γ‡etin; E. Ayyildiz πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 258 KB

In this work, barrier height inhomogeneity and its origin are investigated for Au and Cu/n-InP metal/ semiconductor contacts. The effective barrier height values of the Au and Cu/n-InP Schottky barrier diodes (SBDs) have been obtained as 0.480 and 0.404 eV from current-voltage (I-V) characteristics