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Thermal recovery and lattice expansion of self-irradiated U0.80Am0.20O2−x, an in situ high temperature x-ray diffraction study

✍ Scribed by Prieur, D.; Pagliosa, G.; Spino, J.; Caciuffo, R.; Somers, J.; Eloirdi, R.


Book ID
125427766
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
499 KB
Volume
199
Category
Article
ISSN
0022-4596

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