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Thermal Expansion of Rutile-Type GeO, by the X-Ray Method

✍ Scribed by K. V. KRISHNA RAO; S. V. NAGENDER NAIDU; LEELA IYENGAR


Book ID
110812754
Publisher
John Wiley and Sons
Year
1968
Tongue
English
Weight
222 KB
Volume
51
Category
Article
ISSN
0002-7820

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The charge density and bond character of the rutile-type structures of SiO~2~, GeO~2~ and SnO~2~ were studied by X-ray diffraction using monopole refinement. The refinement of the charge density was performed by least-squares refinement including the Κ-parameter and the electron population in the X-