✦ LIBER ✦
Thermal evaluation of VLSI packages using test chips—a critical review : Frank F. Oettinger. Solid St. Technol. 169 (February 1984)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 130 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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