Thermal conductivity of VLS-grown rough Si nanowires with various surface roughnesses and diameters

✍ Scribed by Yong-Hee Park; Jungwon Kim; Hyoungjoon Kim; Ilsoo Kim; Ki-Young Lee; Dongjea Seo; Heon-Jin Choi; Woochul Kim

• Publisher: Springer
• Year: 2011
• Tongue: English
• Weight: 884 KB
• Volume: 104
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-011-6474-1