Thermal Conductivity Analysis and Device Performance of 1.55 ?m InGaAlAs/InP Buried Tunnel Junction VCSELs

✍ Scribed by Ortsiefer, M. ;Shau, R. ;B�hm, G. ;K�hler, F. ;Rosskopf, J. ;Amann, M.-C.

• Book ID: 101386127
• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 173 KB
• Volume: 188
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200112)188:3<913::aid-pssa913>3.0.co;2-e