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Thermal Conductance Measurements of a Micron-Sized Transition-Edge Hot-Electron Micro-Bolometer

✍ Scribed by Barrentine, Emily M.; Brandl, Donald E.; Brown, Ari D.; Denis, Kevin L.; Hsieh, Wen-Ting; Nagler, Peter C.; Stevenson, Thomas R.; Talley, Dorothy J.; Timbie, Peter T.; U-Yen, Kongpop

Book ID: 118178048
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 230 KB
Volume: 21
Category: Article
ISSN: 1051-8223
DOI: 10.1109/tasc.2010.2089961

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