Thermal behavior of floating gate oxide defects (moving bits)

✍ Scribed by S. Mouhoubi; T. Yao; F. Lalande; P. Canet

• Book ID: 116669977
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 437 KB
• Volume: 353
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2006.11.022