Thermal annealing study of 1 MeV electron-irradiation-induced defects in n[sup +]p InGaP diodes and solar cells

✍ Scribed by Khan, Aurangzeb; Yamaguchi, Masafumi; Bourgoin, Jacques C.; Takamoto, Tatsuya

• Book ID: 121694513
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 433 KB
• Volume: 91
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1433936