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Thermal and free carrier concentration mapping during ESD event in smart Power ESD protection devices using an improved laser interferometric technique

✍ Scribed by C. Fürböck; K. Esmark; M. Litzenberger; D. Pogany; G. Groos; R. Zelsacher; M. Stecher; E. Gornik


Book ID
108361778
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
522 KB
Volume
40
Category
Article
ISSN
0026-2714

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