Thermal analysis of nickel oxide films
β Scribed by P. Bukovec; N. Bukovec; B. Orel; K. S. Wissiak
- Book ID
- 110551717
- Publisher
- Springer Netherlands
- Year
- 1993
- Tongue
- English
- Weight
- 164 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0022-5215
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
In this work, we report an experimental study on optical properties of nickel oxide thin film by UV-visible spectroscopy. The nickel oxide thin film is grown by the oxidation of nickel deposited on ITO (tin doped indium oxide) coated glass substrate. The phase formation and electrical properties are
Anodic oxide films formed on Ni and Ni-Cu alloys in a solution of 1.0 MKOH have been analysed by Auger electron spectroscopy. The results indicate that the oxide film formed is predominantly nickel oxide even when the Cu content in the alloy is 70 %, suggesting that Cu in the alloy does not affect t