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Theory of laterally nonuniform MOS transistor under weak inversion: A technique for determination of interface parameters

✍ Scribed by E. N. Bormontov; M. N. Levin; S. A. Vyalykh; S. N. Borisov


Book ID
110126082
Publisher
Springer
Year
2001
Tongue
English
Weight
80 KB
Volume
46
Category
Article
ISSN
1063-7842

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