Theory of ion beam induced charge measurement in semiconductor devices based on the Gunn's theorem

✍ Scribed by E. Vittone

• Book ID: 113823033
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 336 KB
• Volume: 219-220
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2004.01.210