Theory of defect complexes at semiconductor surfaces : Shang-Fen Ren and R. E. Allen. Solid St. Commun.64, 589, (1987)

• Book ID: 103282927
• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 122 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90247-8