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Theory and technique for measuring the parameters of UHF transistors and transistor structures

✍ Scribed by S. M. Nikulin

Publisher
Springer US
Year
1991
Tongue
English
Weight
192 KB
Volume
34
Category
Article
ISSN
0543-1972

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## Abstract A new two‐step calibration technique to directly measure the scattering parameters of asymmetrical transitional structures is proposed in this article. This technique conducts two calibrations, each one of them for one type of the transition's two ports, and two error boxes associated w