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Theory and applications of 1/ƒ trapping noise in MOSFETs for the whole biasing ranges

✍ Scribed by Zhi-Hao Fang; Alain Chovet; Qiu-Ping Zhu; Jiang-Nan Zhao


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
563 KB
Volume
34
Category
Article
ISSN
0038-1101

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