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Theoretical study on the influence of residual stress on adhesion-induced instability in MEMS

✍ Scribed by Wang, ShiJi ;Li, Xian ;Chen, ZhengHan


Book ID
107371757
Publisher
Elsevier
Year
2009
Tongue
English
Weight
500 KB
Volume
54
Category
Article
ISSN
2095-9273

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