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Theoretical Study of Electron Confinement in Submicrometer GaN HFETs Using a Thermally Self-Consistent Monte Carlo Method

✍ Scribed by Sadi, T.; Kelsall, R.W.


Book ID
114619342
Publisher
IEEE
Year
2008
Tongue
English
Weight
429 KB
Volume
55
Category
Article
ISSN
0018-9383

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