Theoretical study of deep-trap-assisted anomalous currents in worst-bit cells of dynamic random-access memories (DRAM's)

✍ Scribed by Yamaguchi, K.

• Book ID: 114538090
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 171 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.830993