Theoretical research on electron optics

✍ Scribed by Ximen, Jiye

• Book ID: 102888115
• Publisher: Wiley (John Wiley & Sons)
• Year: 1987
• Tongue: English
• Weight: 549 KB
• Volume: 7
• Category: Article
• ISSN: 0741-0581
• DOI: 10.1002/jemt.1060070413

✦ Synopsis

This paper summarizes theoretical research on electron optics in the field of electron microscopy that has been carried out by the author and his colleagues over a long period of time. The main topics to be discussed include the rotationally symmetrical imaging system and its aberrations; the method of matrix algebraic calculation and its applications to electron optics; new developments in scanning electron beam systems, i.e., the combined electromagnetic focusing-deflection system with superimposed fields; the electromagnetic multipole system and its aberrations; the ion optical system with a curvilinear axis and its aberrations; and the phase retrieval in Fourier electron microscopy. This review may help to promote a better understanding of the present state of, and trends in, Chinese electron optics research.