𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Theoretical Angle-Resolved X-Ray Photoelectron Spectra from GaAs (110)

✍ Scribed by A. Chassé; P. Rennert

Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
303 KB
Volume
141
Category
Article
ISSN
0370-1972

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Studies of the UV/Ozone oxidation of GaA
Studies of the UV/Ozone oxidation of GaAs using angle-resolved x-ray photoelectron spectroscopy
✍ B. J. Flinn; N. S. McIntyre 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 938 KB

## Abstract Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) has been used to study the composition of oxides grown on 〈110〉 and 〈100〉 GaAs during exposure to UV/ozone. The effects of substrate treatments on oxide growth were compared on 〈100〉 surfaces exposed to an HF treatment and thermal

Restoration of the depth–concentration p
Restoration of the depth–concentration profile from the angle-resolved relative intensities of x-ray photoelectron spectra
✍ Rudolf Jisl 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 675 KB

## Abstract A numerical method for the restoration of the depth–concentration profile from the angular distribution of XPS intensities is described. The proposed method is based on the regularization theory. A simpler formulation of the basic relationships than has been given in previous works^2–8^