Theoretical and experimental study of subsurface burnout and ESD in GaAs FETs and HEMTs : F. A. Buot, W. T. Anderson, A. Christou and K. J. Sleger. Annual Proceedings of the Reliability Physics Symposium, San Diego, U.S.A., p. 181 (1987)

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 92 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90022-4