Theoretical and experimental study of MOS transistors nonuniformly doped by SILOX technique : G. Doucet, F. Van De Wiele and P. Jespers. Solid-State Electronics19, 191 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 118 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90719-8