✦ LIBER ✦
Theoretical and experimental study of failure mechanisms in r.f. reliability life tested high electron mobility transistors
✍ Scribed by W.T. Anderson; K.A. Christianson; C. Moglestue
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 246 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0921-5107
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