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Theoretical and experimental studies of failure mechanisms in gallium arsenide three-terminal transferred electron devices : H. L. Grubin, W. T. Anderson, Jr. and A. Christou. Proc. IEEE Reliab. Phys. Conf. 52 (1984)


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
135 KB
Volume
25
Category
Article
ISSN
0026-2714

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