Theoretical analysis of effects of deep level, back contact, and absorber thickness on capacitance–voltage profiling of CdTe thin-film solar cells

✍ Scribed by Jian V. Li; Adam F. Halverson; Oleg V. Sulima; Shubhra Bansal; James M. Burst; Teresa M. Barnes; Timothy A. Gessert; Dean H. Levi

• Book ID: 113914672
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 283 KB
• Volume: 100
• Category: Article
• ISSN: 0927-0248
• DOI: 10.1016/j.solmat.2012.01.003