The α-reliable mean-excess regret model
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Gang Chen; Mark S. Daskin; Zuo-Jun Max Shen; Stanislav Uryasev
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Article
📅
2006
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John Wiley and Sons
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English
⚖ 436 KB
## Abstract In this paper, we study a strategic facility location problem under uncertainty. The uncertainty associated with future events is modeled by defining alternative future scenarios with probabilities. We present a new model called the α‐reliable mean‐excess model that minimizes the expect