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The yield of photoelectrons of different energies in the X-ray laue diffraction

✍ Scribed by Afanasev, A. M. ;Imamov, R. M. ;Mukhamedzhangv, E. Kh.

Publisher
John Wiley and Sons
Year
1984
Tongue
English
Weight
217 KB
Volume
83
Category
Article
ISSN
0031-8965

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## Abstract Although not discussed in most reviews of quantitative x‐ray photoelectron spectroscopy (XPS), diffraction of the photoelectrons leaving a single crystal can lead to potential errors of a factor of two or more in the calculated surface composition. A series of experimental measurements